4610TF Ionizer

4610 High Temperature Ionizer with Controller

Neutralizes Static Charge in Environments with Extreme Conditions

Simco-Ion’s High Temperature Ionizer Model 4610TF together with the High Temperature Controller Model 4052E, the Model 4610TF ionizer creates a uniquely capable ionization system that can withstand high heat and extreme cold, two challenging environments that cannot support other means of static elimination.

Withstands temperatures up to 302°F (150°C) and down to -94°F (-70°C)
IsoStat® technology for intrinsically self balancing ionization
Small form factor with large ion output perfect for confined areas
Available with tungsten alloy or single-crystal silicon emitter points (ISO Class 2 compatible)
Unique ion guides help direct airflow towards the target

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Model 4610

For additional information on the 4610 ionizer or other ionization solutions for static control and particle contamination control, contact Sales Services.

+1 (510) 217-0460

+1 (800) 367-2452

salesservices@simco-ion.com

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Specifications

Power	Powered by Model 4052E Controller
Output Voltage	8 kVDC
Discharge	<3 sec @ 6"; <5 sec @ 10”, <10 sec @ 18” distance between ionizer and CPM (±1000-100V) with 90 fpm hood airflow velocity (tested in accordance with ANSI/ESD STM3.1-2000)
Airflow	60-100 fpm (18.3-30.5 mpm)
Dimension	1.5H x 1.2W x 4.5L in. (3.8H x 3.5W x 11.4L cm)
Weight	4 oz (117g)

Related Products
Accessories
Consumables
Documents

High Voltage Connector Kit
Emitter Point Extenders

Silicon Emitter Points

Static Control for Semiconductor Manufacturing Brochure

Target Markets

Back-end Semiconductor Manufacturing

Target Applications

The back-end semiconductor industry uses a series of extensive reliability testing that will ensure the conformance of integrated chips and modules. Testing of the product at extreme high and low temperatures is designed to accelerate real life conditions where the product will be used. The High Temperature 4610 Ionizer System is perfect for the extreme environment where that type of reliability testing occurs.